Study of the Hole Transport Processes in Solution-Processed Layers of the Wide Bandgap Semiconductor Copper(I) Thiocyanate (CuSCN) (2015)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/adfm.201502953
Publication URI: http://dx.doi.org/10.1002/adfm.201502953
Type: Journal Article/Review
Parent Publication: Advanced Functional Materials
Issue: 43