📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! If you would be interested in being interviewed about the improvements we're making and to have your say about how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community, please email gateway@ukri.org.

Quality-control of UV offset lithographicaly printed electronic-ink by THz technology (2017)

First Author: Zeng Y

Attributed to: EPSRC Centre for Innovative Manufacturing in Large Area Electronics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ucmmt.2017.8068504

Publication URI: http://dx.doi.org/10.1109/ucmmt.2017.8068504

Type: Conference/Paper/Proceeding/Abstract