Predicting SiC MOSFET Behavior Under Hard-Switching, Soft-Switching, and False Turn-On Conditions (2017)
Attributed to:
Underpinning Power Electronics 2012: Converters Theme
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tie.2017.2721882
Publication URI: http://dx.doi.org/10.1109/tie.2017.2721882
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Industrial Electronics
Issue: 11