A synchrotron X-ray diffraction study of non-proportional strain-path effects (2017)
Attributed to:
Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.actamat.2016.11.011
Publication URI: http://dx.doi.org/10.1016/j.actamat.2016.11.011
Type: Journal Article/Review
Parent Publication: Acta Materialia