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Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications (2017)

First Author: WINKELMANN A

Attributed to: Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1111/jmi.12571

PubMed Identifier: 28474742

Publication URI: http://europepmc.org/abstract/MED/28474742

Type: Journal Article/Review

Parent Publication: Journal of Microscopy

Issue: 3

ISSN: 0022-2720