Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications. (2017)
Attributed to:
Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1111/jmi.12571
PubMed Identifier: 28474742
Publication URI: http://europepmc.org/abstract/MED/28474742
Type: Journal Article/Review
Volume: 267
Parent Publication: Journal of microscopy
Issue: 3
ISSN: 0022-2720