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In situ ion beam sputter deposition and X-ray photoelectron spectroscopy (XPS) of multiple thin layers under computer control for combinatorial materials synthesis (2016)

First Author: Wilson T

Attributed to: University of Newcastle - Equipment Account funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/sia.6045

Publication URI: http://dx.doi.org/10.1002/sia.6045

Type: Journal Article/Review

Parent Publication: Surface and Interface Analysis

Issue: 1