📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! Tell us what works, what doesn't, and how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community. Please send your feedback to gateway@ukri.org by 11 August 2025.

Characterization, Modelling and Analysis of Light Reflectance During In-Process Surface Measurements Using White Light Based 3D Optical Gauge (2017)

First Author: Barde A

Attributed to: Self-Resilient Reconfigurable Assembly Systems with In-process Quality Improvement funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1115/msec2017-2689

Publication URI: http://dx.doi.org/10.1115/msec2017-2689

Type: Conference/Paper/Proceeding/Abstract