Structure and properties of a model conductive filament/host oxide interface in HfO 2 -based ReRAM (2018)

First Author: Padilha A
Attributed to:  Non-equilibrium electron-ion dynamics in thin metal-oxide films funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1103/physrevmaterials.2.045001

Publication URI: http://dx.doi.org/10.1103/physrevmaterials.2.045001

Type: Journal Article/Review

Parent Publication: Physical Review Materials

Issue: 4