Fast and cost-effective in-process defect inspection for printed electronics based on coherent optical processing. (2018)

First Author: Feng X
Attributed to:  Metrology for precision and additive manufacturing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1364/oe.26.013927

PubMed Identifier: 29877438

Publication URI: http://europepmc.org/abstract/MED/29877438

Type: Journal Article/Review

Volume: 26

Parent Publication: Optics express

Issue: 11

ISSN: 1094-4087