Analyzing and Patching SPEKE in ISO/IEC (2018)

First Author: Hao F

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/TIFS.2018.2832984

Publication URI: http://dx.doi.org/10.1109/TIFS.2018.2832984

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Information Forensics and Security

Issue: 11