Measuring the thermal properties of anisotropic materials using beam-offset frequency domain thermoreflectance (2018)

First Author: Rahman M
Attributed to:  CVD enabled Graphene Technology and Devices (GRAPHTED) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.5033966

Publication URI: http://dx.doi.org/10.1063/1.5033966

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 24