Improving accuracy of nanothermal measurements via spatially distributed scanning thermal microscope probes (2018)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.5031085

Publication URI: http://dx.doi.org/10.1063/1.5031085

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 1