System identification-based frequency domain feature extraction for defect detection and characterization (2018)

First Author: Li P

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.ndteint.2018.04.008

Publication URI: http://dx.doi.org/10.1016/j.ndteint.2018.04.008

Type: Journal Article/Review

Parent Publication: NDT & E International