New perspectives on nano-engineering by secondary electron spectroscopy in the helium ion and scanning electron microscope (2018)
Attributed to:
SEE MORE: SECONDARY ELECTRON EMISSION - MICROSCOPY FOR ORGANICS WITH RELIABLE ENGINEERING-PROPERTIES
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1557/mrc.2018.75
Publication URI: http://dx.doi.org/10.1557/mrc.2018.75
Type: Journal Article/Review
Parent Publication: MRS Communications
Issue: 2