A simplified model to estimate thermal resistance between carbon nanotube and sample in scanning thermal microscopy (2017)
Attributed to:
Non-Destructive Nanoscale Resolution using a Carbon Nanotube Scanning Thermal Probe
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1361-6463/aa900e
Publication URI: http://dx.doi.org/10.1088/1361-6463/aa900e
Type: Journal Article/Review
Parent Publication: Journal of Physics D: Applied Physics
Issue: 49