Nondestructive Thickness Mapping of Wafer-Scale Hexagonal Boron Nitride Down to a Monolayer. (2018)
Attributed to:
CVD enabled Graphene Technology and Devices (GRAPHTED)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/acsami.8b08609
PubMed Identifier: 29979573
Publication URI: http://europepmc.org/abstract/MED/29979573
Type: Journal Article/Review
Volume: 10
Parent Publication: ACS applied materials & interfaces
Issue: 30
ISSN: 1944-8244