Nondestructive Thickness Mapping of Wafer-Scale Hexagonal Boron Nitride Down to a Monolayer. (2018)

First Author: Crovetto A
Attributed to:  CVD enabled Graphene Technology and Devices (GRAPHTED) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/acsami.8b08609

PubMed Identifier: 29979573

Publication URI: http://europepmc.org/abstract/MED/29979573

Type: Journal Article/Review

Volume: 10

Parent Publication: ACS applied materials & interfaces

Issue: 30

ISSN: 1944-8244