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Control of ferromagnetic properties of Ni80Fe20 thin films by voltage-induced oxidation (2018)

First Author: Wood J

Attributed to: High-resolution Electron Beam Lithography Critical Mass Grant funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.5045552

Publication URI: http://dx.doi.org/10.1063/1.5045552

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 8