Fast, Noncontact, Wafer-Scale, Atomic Layer Resolved Imaging of Two-Dimensional Materials by Ellipsometric Contrast Micrography. (2018)
Attributed to:
CVD enabled Graphene Technology and Devices (GRAPHTED)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/acsnano.8b04167
PubMed Identifier: 30080966
Publication URI: http://europepmc.org/abstract/MED/30080966
Type: Journal Article/Review
Volume: 12
Parent Publication: ACS nano
Issue: 8
ISSN: 1936-0851