Above bandgap thermoreflectance for non-invasive thermal characterization of GaN-based wafers (2018)
Attributed to:
Integrated GaN-Diamond Microwave Electronics: From Materials, Transistors to MMICs
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.5040100
Publication URI: http://dx.doi.org/10.1063/1.5040100
Type: Journal Article/Review
Parent Publication: Applied Physics Letters
Issue: 10