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As-grown-Generation Model for Positive Bias Temperature Instability (2018)

First Author: Gao R

Attributed to: Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2018.2857000

Publication URI: http://dx.doi.org/10.1109/ted.2018.2857000

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 9