Radiation hardness studies of AMS HV-CMOS 350 nm prototype chip HVStripV1 (2017)

First Author: Kanisauskas K

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/12/02/P02010

Publication URI: http://dx.doi.org/10.1088/1748-0221/12/02/P02010

Type: Journal Article/Review

Parent Publication: Journal of Instrumentation

Issue: 02