Calculation and measurement of critical temperature in thin superconducting multilayers (2018)
Attributed to:
Photometric and Spectroscopic Superconducting Imaging Technology for Astrophysics
funded by
STFC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1361-6668/aad788
Publication URI: http://dx.doi.org/10.1088/1361-6668/aad788
Type: Journal Article/Review
Parent Publication: Superconductor Science and Technology
Issue: 10