Large Carrier Mobilities in ErMnO 3 Conducting Domain Walls Revealed by Quantitative Hall-Effect Measurements (2018)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/acs.nanolett.8b02742
PubMed Identifier: 30207736
Publication URI: http://europepmc.org/abstract/MED/30207736
Type: Journal Article/Review
Parent Publication: Nano Letters
Issue: 10
ISSN: 1530-6984