Metrology of complex refractive index for solids in the terahertz regime using frequency domain spectroscopy (2018)
Attributed to:
Atomically Deterministic Doping and Readout For Semiconductor Solotronics (ADDRFSS)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1681-7575/aae2c9
Publication URI: http://dx.doi.org/10.1088/1681-7575/aae2c9
Type: Journal Article/Review
Parent Publication: Metrologia
Issue: 6