On the Limits of Scalpel AFM for the 3D Electrical Characterization of Nanomaterials (2018)
Attributed to:
Resistive switches (RRAM) and memristive behaviour in silicon-rich silicon oxides
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/adfm.201802266
Publication URI: http://dx.doi.org/10.1002/adfm.201802266
Type: Journal Article/Review
Parent Publication: Advanced Functional Materials
Issue: 52