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On the Limits of Scalpel AFM for the 3D Electrical Characterization of Nanomaterials (2018)

First Author: Chen S

Attributed to: Structural dynamics of amorphous functional oxides - the role of morphology and electrical stress funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/adfm.201802266

Publication URI: http://dx.doi.org/10.1002/adfm.201802266

Type: Journal Article/Review

Parent Publication: Advanced Functional Materials

Issue: 52