AR-Aided Smart Sensing for In-Line Condition Monitoring of IGBT Wafer (2019)

First Author: Li K
Attributed to:  Novel Sensing Networks for Intelligent Monitoring (Newton) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tie.2018.2886775

Publication URI: http://dx.doi.org/10.1109/tie.2018.2886775

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Industrial Electronics

Issue: 10