Photoconductive laser spectroscopy as a method to enhance defect spectral signatures in amorphous oxide semiconductor thin-film transistors (2019)

First Author: Dhara S
Attributed to:  The Physics and Engineering of Oxide Semiconductors for Large-Area CMOS funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.5070141

Publication URI: http://dx.doi.org/10.1063/1.5070141

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 1