Mapping the flux penetration profile in a 2G-HTS tape at the microscopic scale: deviations from a classical critical state model (2019)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1361-6668/aaf2f5
Publication URI: http://dx.doi.org/10.1088/1361-6668/aaf2f5
Type: Journal Article/Review
Parent Publication: Superconductor Science and Technology
Issue: 2