📣 Try out the NEW Gateway to Research and let us know what you think.

We're looking for users to test the new service during August and September and share their feedback. Express your interest by completing this short form.

Mapping the flux penetration profile in a 2G-HTS tape at the microscopic scale: deviations from a classical critical state model (2019)

First Author: Marchiori E

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1361-6668/aaf2f5

Publication URI: http://dx.doi.org/10.1088/1361-6668/aaf2f5

Type: Journal Article/Review

Parent Publication: Superconductor Science and Technology

Issue: 2