Mapping the flux penetration profile in a 2G-HTS tape at the microscopic scale: deviations from a classical critical state model (2019)

Abstract

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Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1361-6668/aaf2f5

Publication URI: http://dx.doi.org/10.1088/1361-6668/aaf2f5

Type: Journal Article/Review

Parent Publication: Superconductor Science and Technology

Issue: 2