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Chemical Imaging of Buried Interfaces in Organic-Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry (2019)

First Author: Tiddia M

Attributed to: Enabling Next Generation Additive Manufacturing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/acsami.8b15091

PubMed Identifier: 30604956

Publication URI: http://europepmc.org/abstract/MED/30604956

Type: Journal Article/Review

Parent Publication: ACS Applied Materials & Interfaces

Issue: 4

ISSN: 1944-8244