Electron emission and capture by oxygen-related bistable thermal double donors in silicon studied with junction capacitance techniques (2018)

First Author: Markevich V

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.5053805

Publication URI: http://dx.doi.org/10.1063/1.5053805

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 22

ISSN: 10897550 00218979