Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEM. (2018)

First Author: Varambhia A
Attributed to:  South of England Analytical Electron Microscope [ATEM] funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.micron.2018.06.015

PubMed Identifier: 30007859

Publication URI: http://europepmc.org/abstract/MED/30007859

Type: Journal Article/Review

Volume: 113

Parent Publication: Micron (Oxford, England : 1993)

ISSN: 0968-4328