Trigger-When-Charged: A Technique for Directly Measuring RTN and BTI-Induced Threshold Voltage Fluctuation Under Use- ${V}_{dd}$ (2019)
Attributed to:
Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/ted.2019.2895700
Publication URI: http://dx.doi.org/10.1109/ted.2019.2895700
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Electron Devices
Issue: 3