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Hot carrier aging and its variation under use-bias: Kinetics, prediction, impact on Vdd and SRAM (2015)

First Author: Duan M

Attributed to: Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/iedm.2015.7409742

Publication URI: http://dx.doi.org/10.1109/iedm.2015.7409742

Type: Conference/Paper/Proceeding/Abstract