Development of New Characterisation Technique for Interface States Beyond Bandgap (2012)

First Author: Zhang, J. F.
Attributed to:  High permittivity dielectrics on Ge for end of Roadmap application funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Parent Publication: 2012 Ieee 11th International Conference on Solid-State and Integrated Circuit Technology (Icsict-2012)