Reducing the latency between machining and measurement using FEA to predict thermal transient effects on CMM measurement (2019)
Attributed to:
Future Advanced Metrology Hub
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.measurement.2018.11.034
Publication URI: http://dx.doi.org/10.1016/j.measurement.2018.11.034
Type: Journal Article/Review
Parent Publication: Measurement