Reducing the latency between machining and measurement using FEA to predict thermal transient effects on CMM measurement (2019)

First Author: Mian N

Attributed to: Future Advanced Metrology Hub funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.measurement.2018.11.034

Publication URI: http://dx.doi.org/10.1016/j.measurement.2018.11.034

Type: Journal Article/Review

Parent Publication: Measurement