A method for inspecting near-right-angle V-groove surfaces based on dual-probe wavelength scanning interferometry (2018)

First Author: Zhang T
Attributed to:  Future Advanced Metrology Hub funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1007/s00170-018-2331-0

Publication URI: http://dx.doi.org/10.1007/s00170-018-2331-0

Type: Journal Article/Review

Parent Publication: The International Journal of Advanced Manufacturing Technology

Issue: 1-4