A method for inspecting near-right-angle V-groove surfaces based on dual-probe wavelength scanning interferometry (2018)
Attributed to:
Future Advanced Metrology Hub
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1007/s00170-018-2331-0
Publication URI: http://dx.doi.org/10.1007/s00170-018-2331-0
Type: Journal Article/Review
Parent Publication: The International Journal of Advanced Manufacturing Technology
Issue: 1-4