Investigation of Dayem Bridge NanoSQUIDs Made by Xe Focused Ion Beam (2018)
Attributed to:
Integrated Plasma Source Focused Ion Beam with Scanning Electron Microscope
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tasc.2018.2854624
Publication URI: http://dx.doi.org/10.1109/tasc.2018.2854624
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Applied Superconductivity
Issue: 7
ISSN: 10518223