Lifetime reliability characterization of N/MEMS used in power gating of digital integrated circuits (2017)
Attributed to:
Staying alive in variable, intermittent, low-power environments (SAVVIE)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/dft.2017.8244452
Publication URI: http://dx.doi.org/10.1109/dft.2017.8244452
Type: Conference/Paper/Proceeding/Abstract