Lifetime reliability characterization of N/MEMS used in power gating of digital integrated circuits (2017)

First Author: Alrudainy H

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/DFT.2017.8244452

Publication URI: http://dx.doi.org/10.1109/DFT.2017.8244452

Type: Conference/Paper/Proceeding/Abstract