(Invited) Deep-Level Analysis of Passivation of Transition Metal Impurities in Silicon (2018)

First Author: Mullins J

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1149/08610.0125ecst

Publication URI: http://dx.doi.org/10.1149/08610.0125ecst

Type: Journal Article/Review

Parent Publication: ECS Transactions

Issue: 10