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Glancing-incidence focussed ion beam milling: A coherent X-ray diffraction study of 3D nano-scale lattice strains and crystal defects (2018)

First Author: Hofmann F

Attributed to: Phase modulation technology for X-ray imaging funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.actamat.2018.05.018

Publication URI: http://dx.doi.org/10.1016/j.actamat.2018.05.018

Type: Journal Article/Review

Parent Publication: Acta Materialia