Glancing-incidence focussed ion beam milling: A coherent X-ray diffraction study of 3D nano-scale lattice strains and crystal defects (2018)
Attributed to:
Phase modulation technology for X-ray imaging
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.actamat.2018.05.018
Publication URI: http://dx.doi.org/10.1016/j.actamat.2018.05.018
Type: Journal Article/Review
Parent Publication: Acta Materialia