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Selected energy dark-field imaging using low energy electrons for optimal surface phase discrimination. (2019)

First Author: Niu YR

Attributed to: MBE-LEEM: A UK facility for the ultimate control of complex epitaxy funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2019.02.017

PubMed Identifier: 30836287

Publication URI: http://europepmc.org/abstract/MED/30836287

Type: Journal Article/Review

Volume: 200

Parent Publication: Ultramicroscopy

ISSN: 0304-3991