Selected energy dark-field imaging using low energy electrons for optimal surface phase discrimination (2019)
Attributed to:
MBE-LEEM: A UK facility for the ultimate control of complex epitaxy
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2019.02.017
PubMed Identifier: 30836287
Publication URI: http://europepmc.org/abstract/MED/30836287
Type: Journal Article/Review
Parent Publication: Ultramicroscopy
ISSN: 0304-3991