Stretching in Time of GaN Active Gate Driving Profiles to Adapt to Changing Load Current (2018)
Attributed to:
Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/ecce.2018.8557531
Publication URI: http://dx.doi.org/10.1109/ecce.2018.8557531
Type: Conference/Paper/Proceeding/Abstract